Semiconductor packages having leadframe-based connection arrays

ABSTRACT

Methods of forming a semiconductor assembly are described which include a leadframe with leads having offset portions exposed at an outer surface of a material package to form a grid array. An electrically conductive compound, such as solder, may be disposed or formed on the exposed lead portions to form a grid array such as a ball grid array (“BGA”) or other similar array-type structure of dielectric conductive elements. The leads may have inner bond ends including a contact pad thermocompressively bonded to a bond pad of the semiconductor chip to enable electrical communication therewith and a lead section with increased flexibility to improve the thermocompressive bond. The inner bond ends may also be wirebonded to the bond pads.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a continuation of application Ser. No. 11/153,952,filed Jun. 16, 2005, pending, which application is a continuation ofapplication Ser. No. 10/422,250, filed Apr. 24, 2003, now U.S. Pat. No.6,967,127, issued Nov. 22, 2005, which application is a divisional ofapplication Ser. No. 10/136,186, filed May 1, 2002, now U.S. Pat. No.6,836,008, issued Dec. 28, 2004. The disclosure of each of theaforementioned patent applications and patents is incorporated herein byreference.

BACKGROUND OF THE INVENTION

The present invention relates to grid array semiconductor packages andmethods of assembling and evaluating the same. In particular, thepresent invention relates to leadframes for mounting a semiconductorchip for encapsulating to form a complete semiconductor package. Theleadframe includes a plurality of leads having a similar length, withoffset array pads forming a grid array on the surface of the package.

Semiconductor chips or dice are typically enclosed in semiconductorassemblies, or packages, prior to use. These packages protect chips fromthe conditions of the surrounding environment and provide leads or otherconnection points, allowing a chip to be electrically accessed. Packageshave typically included a semiconductor chip bonded to a leadframe,either seated on a die paddle or directly to the leads in aleads-over-chip (“LOC”) attachment. The contact pads on thesemiconductor die are then electrically connected to the chip by wiresin wirebond fashion. The connected leadframe and chip are then placed ina mold cavity and encapsulated in a mold compound to form a completepackage. The leads extend out from the mold compound, allowing the chipto be electrically accessed. Typically, the leads extend laterally fromthe package in a flat array, which may be trimmed and formed into adesired conformation.

As electronic devices have decreased in size, alternative methods ofassembling and packaging semiconductor dice have been used. Thesemethods decrease the “real estate” or area that is required to installthe die on higher-level packaging, such as a printed circuit board.Flip-chip installation of a chip using a ball grid array (“BGA”) reducesthe real estate used to an area the same as or only slightly larger thanthe chip dimensions, but introduces a number of difficulties andshortcomings into the manufacturing process. Attempts have been made inthe art to provide a semiconductor assembly that includes the benefitsof a flip-chip type of attachment while keeping the benefits of aconventional molded package.

Many attempts to combine a grid array onto a molded package haveincluded a leadframe as a component of the complete assembly. Theleadframe supplies a number of advantages to the finished assembly.Leads not only furnish electrical connections, but also provide apathway to conduct heat from a package while in operation. Examples ofsome such packages are disclosed in U.S. Pat. No. 5,847,455 issued Dec.8, 1998 to Manteghi and U.S. Pat. No. 5,663,593 issued Sep. 2, 1997 toMostafazadeh et al., the disclosure of each of which is incorporated byreference in its entirety herein. These patents are directed toassemblies including both leadframes and ball grid arrays that allow theassembly to be mounted in a flip-chip fashion. These assemblies areformed by attaching a semiconductor die to a leadframe die paddle,wirebonding the die to the leads and placing an encapsulant, such as amold compound, over the semiconductor die and the die face of theleadframe. A soldermask is then applied to the opposite face of theleadframe, and holes are formed in the soldermask. Solder balls aredisposed within the holes to form a ball grid array.

With these soldermask-covered leadframe packages, the complete structureof the flat leadframe is protected only by the soldermask on one side.The soldermask adds an additional laminate layer to the assembly,providing additional points for potential contaminant and moistureentry. Applying the soldermask and forming the holes therein addadditional steps to package fabrication, increasing manufacturing costsand the opportunity for error.

U.S. Pat. Nos. 5,715,593 and 6,028,356 issued Feb. 10, 1998 and Feb. 22,2000, respectively, to Kimura, represent an attempt to resolve theseshortcomings. A flat leadframe is attached to a semiconductor die usingwire bonds. The package is then encapsulated in two steps, oneencapsulating the chip and the chip side of the leadframe and oneencapsulating the leadframe. In the latter step, the mold includes bumpswhich contact the leadframe, producing dimples that allow the leads tobe accessed. Solder balls may then be created in the dimples.

By placing the solder balls into package dimples, Kimura-type devicesintroduce additional problems into package formation. As the molds arereused, wear can erode the surface of the contact bumps, requiringreplacement and preventing contact with the leadframe. Mold compoundthat intrudes between the leadframe and a contact bump can form a resinfilm that requires removal or can interfere with the electricalconnection. Removal of this thin film is difficult as it is recessedwithin the dimples.

U.S. Pat. No. 5,866,939, issued Feb. 2, 1999 to Shin et al., thedisclosure of which is incorporated herein by reference in its entirety,is directed to another semiconductor package including a BGA. TheShin-type device is a semiconductor package featuring a semiconductordie attached to a leadframe. The leads of the leadframe are bent,causing the lead ends to terminate at a surface of the package. The leadends are used to form a grid array. The position of the lead end isdetermined by the length of the lead and the direction of the lead path.Shin-type devices thus have multiple leads of differing lengths. Thisapproach may result in a relatively weaker structure, as reinforcementfrom the leadframe may be reduced compared to packages where the leadsare of similar length and run throughout the package. Further, thevaried lead lengths may compromise signal transmission, especially inhigher-speed, higher-frequency devices. Additionally, in the Shin-typepackages, the semiconductor die is connected to the leadframe throughwirebonding, solder joints or bumping, thus adding fabrication steps andmaterials.

BRIEF SUMMARY OF THE INVENTION

The present invention includes apparatus and methods for fabricatingsemiconductor packages, or assemblies. One type of semiconductorassembly includes a leadframe with leads featuring an offset portionexposed at a surface of the package to form a grid array. A volume ofelectrically conductive material, such as solder or a conductive orconductor-filled epoxy, may be disposed or formed on each exposedportion to form an array of solder balls, or other connectionstructures, in a ball grid array (“BGA”) or similar array structure.Semiconductor assemblies may include a leadframe where a lead has aninner bond end wire bonded or thermocompressively bonded to a bond padof the semiconductor chip to enable electrical communication therewith.Leads to be thermocompressively bonded may include a section proximatethe inner bond end with increased flexibility to improve thethermocompressive bond. Leadframes and methods of forming semiconductorassemblies are included within the present invention.

BRIEF DESCRIPTION OF THE DRAWINGS

In the drawings, which depict the best mode presently known for carryingout the invention:

FIG. 1 is a cutaway perspective view of one embodiment of asemiconductor assembly made in accordance with the principles of thepresent invention.

FIG. 1A is a view of an alternative embodiment of an array offset inaccordance with the principles of the present invention.

FIG. 2 is a cutaway side view of a section of the embodiment of FIG. 1.

FIG. 3 is a top view of a ball grid array package made in accordancewith the principles of the present invention.

FIG. 4 is a cutaway side view of a section of another embodiment of asemiconductor assembly made in accordance with the principles of thepresent invention.

FIG. 5 is a side view of part of a lead of the embodiment of FIG. 4.

DETAILED DESCRIPTION OF THE INVENTION

Reference will now be made to FIGS. 1 and 2. FIG. 1 depicts aperspective cutaway view of one embodiment of a semiconductor assembly10 made in accordance with the principles of the present invention. FIG.2 depicts a sectional side view of a section of the embodiment ofFIG. 1. A semiconductor assembly 10 includes a semiconductor chip 12attached in leads-over-chip (“LOC”) fashion to a leadframe 14 by anadhesive element 16. In the depicted embodiment, the adhesive element 16is an adhesive strip, such as a double-sided adhesive polyimide tapesuch as a KAPTONJ tape, but it will be appreciated that any suitableadhesive may be used, including a liquid or gel adhesive.

Leadframe 14 includes a plurality of leads 18, such as leads 18A and18B. Groups of leads 18 are organized into lead sets, such as first leadset 15 and a second lead set 17 on opposing sides of the longitudinalaxis L of the semiconductor chip 12. Within a first lead set 15, theleads 18 have substantially similar lengths, running from a side 11 ofthe assembly 10 toward the longitudinal axis L. Each lead 18 comprises alead shaft 20 that generally runs within a first common plane P1. Alongits length, the lead shaft 20 includes an offset 22 formed as the leadshaft 20 extends out of the first common plane and then returns to thefirst common plane. The offset 22 may include an array pad 24 having aflat surface, although any suitable array pad design may be used. Thearray pad may vary in width or shape from the remainder of the lead. Forexample, FIG. 1A shows an assembly 10A including leads with circulararray pads 24A, which can be useful for forming solder balls therein.Desirably, the array pads 24 of the various leads 18 lie within a secondcommon plane P2, although small variations such as two or more separatecommon planes may be used for specific applications. It will beappreciated that the leadframe may be constructed of any suitablematerial known presently, or in the future, to those skilled in the art,including aluminum, copper and alloys thereof, as well as ferrousalloys.

In the embodiment depicted in FIG. 1, leads 18 protrude from side 11 ofmolding compound 26 of semiconductor assembly 10. In fabricatingassemblies 10 in accordance with the principles of the presentinvention, it may be advantageous to produce leadframe 14 as one of anumber of leadframes 14 on a strip. A number of assemblies 10 may befabricated on the strip, which assemblies 10 are then separated bycutting the strip. Protruding lead ends 19 of leads 18 may result fromsuch a procedure. Alternatively, lead ends 19 may be trimmed flush atside 11. Embodiments where the lead ends 19 are enclosed within themolding compound 26 are also contemplated as within the scope of theinvention, but maybe somewhat more difficult to fabricate. In additionto providing electrical connection to chip 12, leads 18 may also act toconduct heat from assembly 10 during operation. The leads 18 are all ofsubstantially similar length, and two opposite lead sets 15 and 17extend across the majority of the active surface of the chip 12 to be incontact with, and accessible to, bond pads thereon. Exposed lead ends 19increase the ability of leads 18 to conduct heat from the assembly 10,increasing the potential functional life of the assembly 10.

Leads 18 are electrically connected to the semiconductor chip 12. Inthis depicted embodiment, the connection is accomplished by wirebonding.A gold or aluminum wire bond 25 connects an inner bond end 23 of eachlead 18 to a bond pad 13 on the active surface of the chip 12 (FIG. 2).The wire bond 25 may be formed by any suitable means known to thoseskilled in the art. It will be appreciated that any suitable electricalconnection, such as TAB bonding using conductive traces carried on aflexible dielectric film, or the direct thermocompressive bonding of aninner bond end 23 of lead 18 as discussed further herein, may be usedand is within the scope of the present invention.

The mechanically and electrically connected semiconductor chip 12 andleadframe 14 are encapsulated within a dielectric molding compound 26 toform a molded package. One surface 28 of the molding compound 26 lies inthe second common plane P2 of the outer surfaces of array pads 24,leaving exposed at least one surface of the array pads 24. In formingthe assembly 10, the connected semiconductor chip 12 and leadframe 14are placed in a mold cavity, which is then transfer molded, injectionmolded or pot molded with molding compound 26 to form the completemolded package of the assembly 10. In a currently preferred embodiment,the molding process is transfer molding using a silicon particle-filledthermoplastic polymer. The array pads 24 of the leads 18 contact asurface of the mold cavity, resulting in the molding compound surface 28residing in the same common plane P2 as the array pads 24. As a moldingcompound 26 enters the mold cavities as a flow front under high pressureand temperature, a thin film or “flash” of molding compound 26 may formbetween the array pads 24 and the adjacent mold cavity surface.Depending on the thickness of the film, it may be necessary to clean thefilm from the array pads 24 to allow an electrical connection to be madeto those array pads 24. This cleaning may require as little as amechanical scrub of the array pads 24 or it may require that a chemicaletch be performed to expose the surface of the array pads 24.

Desirably, a volume of electrically conductive material is then disposedon each of the array pads 24 to allow the assembly to be mounted andattached in a flip-chip fashion to higher-level packaging such as acircuit board. In the depicted embodiment, the conductive attachmentmaterial is shown as solder balls 30 disposed on the array pads 24. Itwill be appreciated that any suitable electrically conductive materialknown now, or in the future, to those skilled in the art may be used fordiscrete conductive elements to enable the assembly 10 to be attached.Suitable conductive materials include tin/lead solder, electricallyconductive epoxy, conductively filled epoxy or any other suitableelectrically conductive material that maybe fashioned into a discreteconductive element by those of ordinary skill in the art. Examples ofsuch discrete conductive elements include solder balls and conductivecolumns or pillars. The electrically conductive material maybe disposedupon the accessible array pads 24 by disposing masses of solder pasteupon the array pads followed by flowing the solder to form solder balls.Suitable techniques for alternative structures known to those skilled inthe art may similarly be used. It is also contemplated that a Z-axisanisotropically conductive film may be disposed over the surface of themolded package having the exposed array pads 24 in lieu of usingdiscrete conductive elements.

An offset 22 may be located at any position along the shaft 20 of a lead18. Desirably, leads 18 of a first lead set 15 will include severalsubsets, each subset having offsets 22 located at a common position. Theleads 18 of each subset may be alternated, as shown in FIG. 1, toproduce four rows of array pads 24. This places the array pads 24 of thefirst lead set 15 at several different common lateral positions withrespect to longitudinal axis L, creating a grid array of array pads 24.

FIG. 3 depicts a top view of a semiconductor assembly 40 fabricated inaccordance with the principles of the present invention. Surface 48features solder balls 42 disposed on the exposed array pads 24 (notvisible), forming a ball grid array. One embodiment of a desirable gridarray is depicted. By positioning offsets 22, an even number of rows ofarray pads 24 are aligned around longitudinal axis of centerline L ofthe assembly 40, which may also serve as a centerline of the leadframe14 and semiconductor chip 12. Each set of rows is formed by a first leadset 15 having substantially equal length, with the individual rowsformed by subsets of leads 18 with array pads 24 at common positions asdescribed above. Within a set of rows, there is an inner row 44 locatedproximal to the centerline L and a distal outer row 46. It will beappreciated that any desired number of rows are possible and thatembodiments which lack a uniform row structure in favor of anindividualized pattern are also possible. All such embodiments arewithin the scope of the present invention.

From the foregoing description, it can be seen that the principles ofthe present invention result in a semiconductor assembly including aleadframe having substantially the same length leads that create amultiposition grid array through a mold compound surface of a moldedpackage. Such an assembly has a number of advantages, includingrelatively small size, enhanced heat conduction, a robust structure andimproved sealing of the assembly components.

Turning to FIG. 4, a side view of a section of another embodiment of asemiconductor assembly 60 made in accordance with the principles of thepresent invention is depicted. A semiconductor chip 62 is attached to alead 68 of a leadframe (depicted as a section of neighboring lead 64) byan adhesive element 66 in LOC chip fashion. As described above, withrespect to FIGS. 1 and 2, an offset 72 includes an array pad 74 exposedthrough molding compound 76 on surface 78. Solder balls 80 disposed onthe array pads 74 create a ball grid array. It will be appreciated thatstructures and features equivalent to those discussed above, inconnection with FIGS. 1 to 3, may be included in embodiments similar tothat of FIG. 4, and insofar as there are common features, the priordiscussion of such common features applies here as well. This discussionaccordingly will focus on the additional features of FIG. 4.

Lead shaft 70 runs from a side 61 of the semiconductor assembly 60towards inner bond end 82 directed towards the center of the assembly60. Inner bond end 82 is directly thermocompressively bonded to a bondpad 84 located on the longitudinal axis or centerline L of semiconductorchip 62.

FIG. 5 depicts the lead 68 of FIG. 4, allowing inner bond end 82 to beseen in greater detail. Inner bond end 82 may feature a contact pad 90located at the underside of the inner bond end 82 of shaft 70. Contactpad 90 is configured for bonding to a bond pad 84 when subjected to anappropriate thermocompressive effect. To enhance the ability of thecontact pad 90 in forming the bond, inner bond end 82 may desirablyinclude an area of increased flexibility adjacent and outboard fromcontact pad 90. Undercut 92 is located on the chip side of the shaft 70,adjacent to contact pad 90. Undercut 92 comprises a thinner section orsmaller cross-section segment of the shaft 70. The shaft 70 may beformed with undercut 92 in place. Alternatively, undercut 92 may beformed by etching or grinding material from a segment of the shaft 70.

This thinner section of shaft 70 formed by the undercut 92 increases theflexibility of the shaft 70 at the inner bond end 82 in directionsperpendicular to the axis of the shaft 70 as depicted by arrow 94. Innerbond end 82 and specifically contact pad 90 of shaft 70 thus may beeasily moved downwards toward the bond pad 84 in order to facilitateforming the thermocompressive bond therewith. It will be appreciatedthat the thermocompressive bond between contact pad 90 and bond pad 84may be formed by any suitable means known now, or in the future, tothose skilled in the art. It is also contemplated that a conductive orconductor-filled adhesive may be used to form an electrical andmechanical connection between contact pads 90 and bond pads 84.Likewise, a Z-axis anisotropic conductive film may be disposedtherebetween.

In accordance with the description provided, the present inventionincludes methods of forming semiconductor assemblies that includeleads-over-chip leadframes with substantially one-length leads forming agrid array through offset positioning. Similarly, the present inventionincludes methods of forming semiconductor assemblies which includeleadframes forming an upset grid array that are thermocompressivelybonded to a semiconductor chip.

It will be appreciated that the foregoing leadframes, semiconductorassemblies, and methods of forming assemblies result in structures withadvantages over the prior art. Such assemblies include a molded packagewith inherent sealing and protection, are reinforced by a number ofsimilar-length leads creating a stronger package, include a grid arraythat can feature a BGA, SLICC or similar structure, may include leadsallowing for improved thermocompression bonding, and allow for thesemiconductor chip to be mounted in a LOC fashion. The grid array may bepositioned to form an assembly that is only slightly larger than thesemiconductor chip. Since a leadframe is used in forming the assembly,no expensive retooling of fabrication equipment is required.

It is apparent that details of the apparatus and methods hereindescribed can be varied considerably without departing from the conceptand scope of the invention. The claims alone define the scope of theinvention as conceived and as described herein.

1. A semiconductor device package, comprising: a packaging material; atleast one lead having a first portion extending in a plane within thepackaging material and including a second, bent lead portion extendingout of the plane to a pad substantially coplanar with a portion of anexterior surface of the packaging material.
 2. The semiconductor devicepackage of claim 1, wherein the second, bent lead portion of the atleast one lead returns to a third portion of the at least one leadextending in the plane.
 3. The semiconductor device package of claim 2,wherein an end of the third portion is exposed through another portionof the exterior surface of the packaging material.
 4. The semiconductordevice package of claim 3, wherein the end of the third portion issubstantially flush with the another portion of the exterior surface ofthe packaging material.
 5. The semiconductor device package of claim 1,wherein the at least one lead is of substantially constant thickness,measured transverse to the plane.
 6. The semiconductor device package ofclaim 1, wherein the at least one lead comprises a plurality of leads,and wherein: a first lead of the plurality extends in a first directionparallel to the plane; a second lead of the plurality extends in thefirst direction parallel to the plane, parallel to the first lead andlaterally adjacent thereto; and the first portions of the first lead andthe second lead differ in length.
 7. The semiconductor device package ofclaim 6, wherein the first lead and the second lead have ends of therespective first portions thereof terminating within the packagingmaterial along a common line perpendicular to the first direction. 8.The semiconductor device package of claim 7, wherein the second, bentlead portions of the first lead and the second lead return to respectivethird lead portions extending in the plane.
 9. The semiconductor devicepackage of claim 7, further comprising: a semiconductor chip disposedwithin the packaging material and having an active surface adjacent thefirst and second leads; and a plurality of bond pads on the activesurface proximate the ends of the first portions of the first and secondleads; wherein a different bond pad of the plurality is coupled to theends of each of the first portions of the first and second leads. 10.The semiconductor device package of claim 9, wherein the couplingcomprises one of wire bonds and thermocompression bonds.
 11. Thesemiconductor device package of claim 9, further comprising discreteconductive elements disposed on at least some of the pads.
 12. Thesemiconductor device package of claim 1, wherein the package comprisesan in-prosess package.
 13. A semiconductor device package, comprising: asemiconductor chip having an active surface with a plurality of bondpads disposed thereon proximate a centerline thereof; a plurality ofleads comprising: a first set of mutually parallel leads adjacent theactive surface, extending in a plane thereto and perpendicular to thecenterline toward a periphery of the semiconductor chip; and a secondset of mutually parallel leads adjacent the active surface, extending inthe plane parallel thereto and perpendicular to the centerline toward anopposing periphery of the semiconductor chip; each lead of the pluralityincluding a bent lead portion extending out of the plane to a pad havinga surface substantially parallel to the plane.
 14. The semiconductordevice package of claim 13, wherein the bent lead portions of leads ofthe plurality return to the plane.
 15. The semiconductor device packageof claim 13, further comprising a packaging material encapsulating atleast the active surface of the semiconductor chip, wherein the padsurfaces of the leads of the plurality are exposed through andsubstantially flush with a portion of an exterior surface of thepackaging material.
 16. The semiconductor device package of claim 15,wherein the packaging material substantially completely surrounds thesemiconductor chip.
 17. The semiconductor device package of claim 16,wherein an end of each lead is exposed through another portion of theexterior surface of the packaging material.
 18. The semiconductor devicepackage of claim 17, wherein the end of each third portion issubstantially flush with the another portion of the exterior surface ofthe packaging material.
 19. The semiconductor device package of claim13, wherein each lead of the plurality is of substantially constantthickness, measured transverse to the plane.
 20. The semiconductordevice package of claim 13, wherein the bent portions of adjacent leadsof the mutually parallel leads of a group of leads are located atdiffering distances from the centerline.
 21. The semiconductor devicepackage of claim 13, wherein bond pads of the plurality are coupled toends of the first portions of the first and second leads.
 22. Thesemiconductor device package of claim 21, wherein the coupling comprisesone of wire bonds and thermocompression bonds.
 23. The semiconductordevice package of claim 13, further comprising discrete conductiveelements disposed on pad surfaces of leads of the plurality.
 24. Thesemiconductor device package of claim 13, wherein the package comprisesan in-process package.